For citations:
Pankov D.A., Pankov I.A. Detecting system defects of digital devices in the course of malfunction imitation using fuzzing. Dependability. 2023;23(4):51-58. (In Russ.) https://doi.org/10.21683/1729-2646-2023-23-4-51-58
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ISSN 1729-2646 (Print)
ISSN 2500-3909 (Online)
ISSN 2500-3909 (Online)
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