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For citations:

Vasin V.A., Ivashov E.N., Stepanchikov S.V. RELIABILITY OF PIEZOELECTRIC SCANNERS IN PROBE MICROSCOPY. Dependability. 2013;(1):92-114. https://doi.org/10.21683/1729-2646-2013-0-1-92-114



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ISSN 1729-2646 (Print)
ISSN 2500-3909 (Online)

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