MECHANISMS AND PROBABILITIES OF FUNCTIONAL FAILURES OF MICROELECTRONIC ELEMENT BASE UNDER ELECTROMAGNETIC PULSE INTERFERENCE
https://doi.org/10.21683/1729-2646-2015-0-3-65-72
Abstract
The paper considers computational and experimental methods for defining the probability of functional failures for the electronic component base under electromagnetic pulse interference. The analysis of the properties of the pulse interference random process and the physical mechanisms of interference influence on electronic node elements is carried out. The ways of failure probability calculation based on the concept of the probabilistic interference nature are elaborated. It is shown that the analysis of interference influence enables to prove the choice of pulse equivalence conditions, which is vital for electromagnetic compatibility.
About the Authors
K. A. Bochkov
Belarusian State University of Transport
Belarus
Doctor of Technical Sciences, Professor, Vice Rector for Research
Belarus
Doctor of Technical Sciences, Professor, Vice Rector for Research
D. V. Komnatny
Belarusian State University of Transport
Belarus
PhD Engineering, Associate Professor, Doctoral Candidate of Chair of Signalling and Remote Control
Belarus
PhD Engineering, Associate Professor, Doctoral Candidate of Chair of Signalling and Remote Control
References
1. Shubinsky I.B. Functional reliability of information systems. Methods of analysis. – Ulyanovsk, printing house «Pechatny Dvor», 2012. – 296 p.
2. Konovalov G.V., Tarasenko I.М. Pulse random processes in telecommunication. – М. : Svyaz, 1973. – 304 p.
3. Ivanov М.Т., Sergienko А.B., Ushakov V.N. Radio circuits and signals. – SPb. : Piter, 2014. – 336 p.
4. Pirogov Y.А., Solodov А.V. Defects of integrated circuits in radio fields. Radio electronics magazine. – 2013. – No 6. – P. 10–15.
5. Dobykin V.D., Kupriyanov А.I., Ponomaryov V.G., Shustov L.N. Electronic warfare: Power defeat of radioelectronic systems. – М.: Vuzovskaya kniga, 2007. – 468 p.
6. Naumov Y.Е., Avaev N.А., Bedrekovsky М.А. Device immunity in integrated logical circuits. – М.: Soviet radio, 1975. – 216 p.
7. Kechiev L.N. Engineering of printed boards for digital high-speed equipment. – М.: ООО Group «IDT», 2007. – 616 p.
8. Pevnitsky V.P., Polozok Y.V. Statistics of man-made interference. – М.: Radio and communication, 1988. – 246 p.
9. Kravchenko V.I. Lightning protection of radioelectronic equipment. – М.: Radio and communication, 1991. – 264 p.
10. Apollonsky S.М., Gorsky А.N. Calculations of electromagnetic fields. – М.: Marshrut, 2006. – 992 p.
11. Bochkov К.А. Theory and methods of control of electromagnetic compatibility of train safety microelectronic systems: thesis for Dr. Sci. 05.22.08 / Moscow State University of Railway engineering. – М, 1993. – 379 p.: il.
12. Bochkov K.A. Principles of achieving EMC of microelectronic systems controlling major sequences of operations / K. A. Bochkov // Proceedings of 1994 International Symposium on Electromagnetic Compatibility / IEICE. – Tokyo: IEICE, 1994. – P. 610–613.
13. Bochkov K.A. Determination of EMC degree based on probability models of microelectronic systems ensuring railway traffic safety / K. A. Bochkov, I. E. Zakharov, N. V. Ryazantseva // Proceedings of International Symposium EMC’98, Rome, Italy, 1998 / University “La Sapienza”. – Roma: University “La Sapienza”, 1998. – P. 707–709.
14. Bochkov K.A., Berezyatsky Y.F., Ryazantseva N.V. Interference pulses in equivalent representation. Problems and future development of automation equipment, communication and computer facilities on railway transport: col. of research papers / RSTU. – Rostov on Don: RSTU, 1999. – P. 103–107.
15. Berezyatsky Y.F. Methods of tests for interference immunity of microelectronic systems ensuring railway traffic safety: thesis for PhD/ Belarusian State University of Transport. – Gomel, 2003. – 24 p.
16. Komyagin S.I., Eryashev D.I., Lafishev М.А. Necessity and ways of improvement of electromagnetic tests. EMC technologies. – 2010. – No 4. – P. 22-26.
Review
For citations:
Bochkov K.A., Komnatny D.V. MECHANISMS AND PROBABILITIES OF FUNCTIONAL FAILURES OF MICROELECTRONIC ELEMENT BASE UNDER ELECTROMAGNETIC PULSE INTERFERENCE. Dependability. 2015;(3):65-72. https://doi.org/10.21683/1729-2646-2015-0-3-65-72
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ISSN 1729-2646 (Print)
ISSN 2500-3909 (Online)
ISSN 2500-3909 (Online)
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