EVALUATION METHODOLOGY OF C-PERCENTILE TIME TO FAILURE OF ELECTRONIC COMPONENTS IN INFORMATIONMEASURING SYSTEMS BY SHORT-TERM TEST RESULTS
https://doi.org/10.21683/1729-2646-2015-0-2-82-89
Abstract
Elementwise evaluation of dependability measures is carried out during designing information – measuring systems. Climatic conditions essentially affect operability of resistors. The paper offers evaluation methodology of resistors’ dependability measures, which is used at change of their operation conditions. Based on results of short-term reliability tests in the specified conditions, dependability measures of resistors are calculated by prediction of electric parameters values of resistors during their life.
About the Authors
A. S. Ishkov
Penza State University
Russian Federation
PhD Engineering, associate professor of chair of Radio equipment and radio electronic systems
Russian Federation
PhD Engineering, associate professor of chair of Radio equipment and radio electronic systems
V. D. Zuev
JSC NIIEMP
Russian Federation
PhD Engineering, Head of NPK-4, scientific secretary
Russian Federation
PhD Engineering, Head of NPK-4, scientific secretary
References
1. Ishkov A.S. Method of dependability time measures increase IET // Petersburg journal of electronics. – 2009. – No1. – pp. 76 – 78.
2. GOST 2.124-85 Unified system of design documentation. The order of application of bought-in products.
3. OST 11070.050-84 Capacitors and resistors. Methods of the accelerated evaluation of storageability.
4. Ostreykovsky V.A. Dependability theory. The textbook for high schools – M.: High school, 2003. – 463 p.
5. Tjurin Yu.N., Makarov A.A. Data analysis on a computer. Version 3, Ed.. V.E.Figurnov – M.: INFRA – M, 2002. – 528 p.
6. Gmurman V.E. Probability theory and mathematical statistics: Teaching aid for high schools – 9 issue, – M.: High school, 2003. – 479 p.
7. G. Mathematical methods of statistics – M.: World, 1975. – 648 p.
8. Gnedenko B.V. Mathematical methods in dependability theory. – M.: Science, 1965. – 524p.
Review
For citations:
Ishkov A.S., Zuev V.D. EVALUATION METHODOLOGY OF C-PERCENTILE TIME TO FAILURE OF ELECTRONIC COMPONENTS IN INFORMATIONMEASURING SYSTEMS BY SHORT-TERM TEST RESULTS. Dependability. 2015;(2):82-89. https://doi.org/10.21683/1729-2646-2015-0-2-82-89
Views:
629
ISSN 1729-2646 (Print)
ISSN 2500-3909 (Online)
ISSN 2500-3909 (Online)
Email this article 