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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">sustain</journal-id><journal-title-group><journal-title xml:lang="ru">Надежность</journal-title><trans-title-group xml:lang="en"><trans-title>Dependability</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1729-2646</issn><issn pub-type="epub">2500-3909</issn><publisher><publisher-name>RAMS Journal Limited liability company</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.21683/1729-2646-2015-0-2-82-89</article-id><article-id custom-type="elpub" pub-id-type="custom">sustain-88</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>СТРУКТУРНАЯ НАДЕЖНОСТЬ. ТЕОРИЯ И ПРАКТИКА</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>STRUCTURAL RELIABILITY. THE THEORY AND PRACTICE</subject></subj-group></article-categories><title-group><article-title>МЕТОДИКА ОЦЕНКИ ГАММА-ПРОЦЕНТНОЙ НАРАБОТКИ РАДИОЭЛЕКТРОННЫХ КОМПОНЕНТОВ ИНФОРМАЦИОННО-ИЗМЕРИТЕЛЬНЫХ СИСТЕМ ПО РЕЗУЛЬТАТАМ КРАТКОВРЕМЕННЫХ ИСПЫТАНИЙ</article-title><trans-title-group xml:lang="en"><trans-title>EVALUATION METHODOLOGY OF C-PERCENTILE TIME TO FAILURE OF ELECTRONIC COMPONENTS IN INFORMATIONMEASURING SYSTEMS BY SHORT-TERM TEST RESULTS</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ишков</surname><given-names>А. С.</given-names></name><name name-style="western" xml:lang="en"><surname>Ishkov</surname><given-names>A. S.</given-names></name></name-alternatives><bio xml:lang="ru"><p>кандидат технических наук, доцент кафедры «Радиотехника и радиоэлектронные системы»</p></bio><bio xml:lang="en"><p>PhD Engineering, associate professor of chair of Radio equipment and radio electronic systems</p></bio><email xlink:type="simple">ishkovanton@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Зуев</surname><given-names>В. Д.</given-names></name><name name-style="western" xml:lang="en"><surname>Zuev</surname><given-names>V. D.</given-names></name></name-alternatives><bio xml:lang="ru"><p>кандидат технических наук, начальник НПК-4, ученый секретарь</p></bio><bio xml:lang="en"><p>PhD Engineering, Head of NPK-4, scientific secretary</p></bio><email xlink:type="simple">slavazuevpenza@yandex.ru</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Пензенский государственный университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Penza State University</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>ОАО "НИИЭМП"</institution><country>Россия</country></aff><aff xml:lang="en"><institution>JSC NIIEMP</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2015</year></pub-date><pub-date pub-type="epub"><day>06</day><month>07</month><year>2016</year></pub-date><volume>0</volume><issue>2</issue><fpage>82</fpage><lpage>89</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Ишков А.С., Зуев В.Д., 2016</copyright-statement><copyright-year>2016</copyright-year><copyright-holder xml:lang="ru">Ишков А.С., Зуев В.Д.</copyright-holder><copyright-holder xml:lang="en">Ishkov A.S., Zuev V.D.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://www.dependability.ru/jour/article/view/88">https://www.dependability.ru/jour/article/view/88</self-uri><abstract><p>При проектировании информационно-измерительных систем выполняется поэлементная оценка показателей надежности. На работоспособность резисторов существенно влияют климатические условия. Предлагается методика оценки показателей надежности резисторов, которая используется при изменении их условий эксплуатации. На основе результатов испытаний на кратковременную безотказность в заданных условиях вычисляются показатели надежности резисторов путем прогнозирования значений электрических параметров резисторов в течение их наработки.</p></abstract><trans-abstract xml:lang="en"><p>Elementwise evaluation of dependability measures is carried out during designing information – measuring systems. Climatic conditions essentially affect operability of resistors. The paper offers evaluation methodology of resistors’ dependability measures, which is used at change of their operation conditions. Based on results of short-term reliability tests in the specified conditions, dependability measures of resistors are calculated by prediction of electric parameters values of resistors during their life.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>кратковременные испытания</kwd><kwd>температура</kwd><kwd>прогнозирование</kwd><kwd>резистор</kwd><kwd>вероятность</kwd></kwd-group><kwd-group xml:lang="en"><kwd>short-term tests</kwd><kwd>temperature</kwd><kwd>prediction</kwd><kwd>resistor</kwd><kwd>probability</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Ишков А.С. Методы повышения временных показателей надежности ИЭТ // Петербургский журнал электроники. - 2009. - №1. - с. 76 - 78.</mixed-citation><mixed-citation xml:lang="en">Ishkov A.S. 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