For citations:
Kofanov Yu.N., Strelnikov V.P. METHODOLOGICAL IMPRECISION OF PREDICTION OF ELECTRONICS’ MEAN LIFE TIME. Dependability. 2015;(1):5-12. https://doi.org/10.21683/1729-2646-2015-0-1-5-12
ISSN 1729-2646 (Print)
ISSN 2500-3909 (Online)
ISSN 2500-3909 (Online)
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