ANALYSIS OF PREDICTION OF RELIABILITY OF LONG-CHANNEL FIELD-EFFECT TRANSISTORS WITH APPLICATION OF POWER-LAW DEPENDENCE OF LIFETIME TL ON SUBSTRATE CURRENT ISUB

A. N. Volkov

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Volkov A.N. ANALYSIS OF PREDICTION OF RELIABILITY OF LONG-CHANNEL FIELD-EFFECT TRANSISTORS WITH APPLICATION OF POWER-LAW DEPENDENCE OF LIFETIME TL ON SUBSTRATE CURRENT ISUB. Dependability. 2015;(4):47-56. https://doi.org/10.21683/1729-2646-2015-0-4-47-56

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This work is licensed under a Creative Commons Attribution 4.0 License.

ISSN 1729-2646 (Print)
ISSN 2500-3909 (Online)

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