sustainНадежностьDependability1729-26462500-3909RAMS Journal Limited liability company10.21683/1729-2646-2015-0-4-47-56sustain-102Research ArticleСТРУКТУРНАЯ НАДЕЖНОСТЬ. ТЕОРИЯ И ПРАКТИКАSTRUCTURAL RELIABILITY. THE THEORY AND PRACTICEАНАЛИЗ ПРОГНОЗИРОВАНИЯ НАДЕЖНОСТИ ДЛИННО-КАНАЛЬНЫХ ПОЛЕВЫХ ТРАНЗИСТОРОВ С ПРИМЕНЕНИЕМ СТЕПЕННОЙ ЗАВИСИМОСТИ СРОКА СЛУЖБЫ TL ОТ ТОКА ПОДЛОЖКИ ISUBANALYSIS OF PREDICTION OF RELIABILITY OF LONG-CHANNEL FIELD-EFFECT TRANSISTORS WITH APPLICATION OF POWER-LAW DEPENDENCE OF LIFETIME TL ON SUBSTRATE CURRENT ISUBВолковА. Н.VolkovA. N.

аспирант

Postgraduate student

artem.n.volkov@yandex.ruФГУП НИИ Физических проблем им. Ф.В.ЛукинаРоссияF.V. Lukin State Research Institute of Physical ProblemsRussian Federation201506072016044756Copyright © Волков А.Н., 20162016Волков А.Н.Volkov A.N.This work is licensed under a Creative Commons Attribution 4.0 License.https://www.dependability.ru/jour/article/view/102

В работе исследовано влияние конструктивно-технологических параметров полевых металл-оксид-полупроводник-транзисторов (МОПТ) на прогнозирование надежности в степенной зависимости срока службы tL от тока подложки ISUB. Найдены конструктивно-технологические параметры, способные влиять на деградацию приборных характеристик МОПТ, вызванную инжекцией горячих носителей. Автор выражает благодарность научному руководителю, д.т.н., профессору Коробову А.И. за поддержку настоящей работы и ряд важных замечаний.

This paper covers the influence of structural and technological parameters of field metal-oxidesemiconductor-transistors (MOSFET) on reliability prediction in power-law dependence of lifetime tL from substrate current of Isu. The structural and technological parameters capable to influence degradation of MOSFET instrument characteristics caused by injection of hot carriers are defined. The author would like to express his gratitude to the research supervisor, Doctor of Technical Sciences, Professor Korobov A.I. for support of the present paper and a number of important comments.

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The authors declare that there are no conflicts of interest present.