Methodology for assessing the radioelectronic equipment reliability in conditions of changing ambient temperature
https://doi.org/10.21683/1729-2646-2026-26-1-44-48
Abstract
The generally accepted methodology for calculating reliability indicators, proposed by Russian and foreign reliability assessment standards, does not take into account changes in ambient temperature over time. For the radio electronics that continuously operate for a year or several years in changing climatic conditions (for example, outdoors), this approach may be inaccurate. This is due to the fact that the temperature coefficient, which takes into account the thermal stress, depends on temperature non‑linearly. Therefore, for a more accurate assessment of reliability, temperature variations must be taken into account in the calculations.
Aim. To propose a method for assessing reliability during continuous outdoor operation, taking into account temperature changes over time.
Methods. The article uses methods of the statistical reliability theory, mathematical analysis and numerical methods.
Results. A method for assessing the reliability is proposed, taking into account temperature changes over time. A mathematical model is presented that describes changes in ambient temperature throughout the year, on the basis of which it is possible to calculate the failure rate of the radio electronics during continuous operation in outdoor conditions. Using the proposed method, the operational failure rate of a 16 Megabit ROM chip made using NMOS technology is calculated when operating continuously outdoors for a year. A quantitative assessment of the discrepancy between the results of calculating the failure rate when using a technique that does not take into account temperature variations has been carried out. The dependence of the discrepancy between the results and the values of the activation energy and the operating temperature is shown.
Conclusion. The approach proposed in the article makes it possible to calculate the reliability, taking into account temperature changes over time. Based on the proposed methodology, it is possible to more accurately calculate failure rate during continuous operation in outdoor conditions.
About the Authors
L. R. KirillovRussian Federation
Leonid Romanovich Kirillov – a postgraduate student, Lobachevsky State University of Nizhny Novgorod; junior modeling engineer, Radio Gigabit LLC
Yu. I. Luzhavin
Russian Federation
Yuri Ivanovich Luzhavin – Head of the Department of modeling physical processes, Radio Gigabit LLC. Ex-head of the Reliability Department of Polyot JSC
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Review
For citations:
Kirillov L.R., Luzhavin Yu.I. Methodology for assessing the radioelectronic equipment reliability in conditions of changing ambient temperature. Dependability. 2026;26(1):44-48. (In Russ.) https://doi.org/10.21683/1729-2646-2026-26-1-44-48
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