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Detecting system defects of digital devices in the course of malfunction imitation using fuzzing

https://doi.org/10.21683/1729-2646-2023-23-4-51-58

Abstract

Aim. The paper proposes approaches to the organisation of testing of digital systems through malfunction imitation for the purpose of ensuring compliance of international and Russian failure and fault resistance standards for the purpose of efficient (in terms of time) detection of software defects as part of mass production of products. The paper proposes a structure and operating algorithm of a hardware and software test bed for malfunction simulation intended for testing a system’s devices. The test bed collects and processes data for fuzzing, hardware error identification, as well as defines the scope of testing.

Methods. The paper used basic systems approach, classical methods of the probability theory and mathematical statistics, decision theory, methods of hardware and software testing and development, mathematical theory of fuzzy sets and fuzzy logic.

Results. Malfunction simulation algorithms were developed for the purpose of testing hardware and software systems using fuzzing that ensure probabilistic estimation of the termination time of testing with a specified accuracy.

Conclusions. The above set of algorithms allows detecting system defects in the process of software and hardware integration into a single system that cause new malfunctions (emergence) that cannot be taken into consideration at the design stage.

About the Authors

D. A. Pankov
AO ONIIP
Russian Federation

Denis A. Pankov - Candidate of Engineering, Deputy Head of Research and Engineering Department.

Omsk



I. A. Pankov
Omsk State Technical University
Russian Federation

Ilia A. Pankov - postgraduate student, OmSTU, Department of Automated Information Processing and Control Systems.

Omsk



References

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Review

For citations:


Pankov D.A., Pankov I.A. Detecting system defects of digital devices in the course of malfunction imitation using fuzzing. Dependability. 2023;23(4):51-58. (In Russ.) https://doi.org/10.21683/1729-2646-2023-23-4-51-58

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ISSN 1729-2646 (Print)
ISSN 2500-3909 (Online)