For citations:
Yakubovich B.I. Fundamental electrical noises and nondestructive testing of electronic devices. Dependability. 2017;17(2):31-35. https://doi.org/10.21683/1729-2646-2017-17-2-31-35
Yakubovich B.I. Fundamental electrical noises and nondestructive testing of electronic devices. Dependability. 2017;17(2):31-35. https://doi.org/10.21683/1729-2646-2017-17-2-31-35