Identification of dependability indicators of manufactured samples of radioelectronic systems
https://doi.org/10.21683/1729-2646-2017-17-1-27-31
Abstract
The article deals with the identification of dependability of manufactured samples of radioelectronic systems. This task belongs to the class of a posteriori analysis. In order to identify the dependability characteristics of equipment, upon production of a pilot batch one performs a posteriori analysis whose first stage is the statistical test (ST). There are a lot of methods for such tests that primarily depend on identifying the time of test completion (r – to failure of r systems, T – upon reaching operation time T, n – to failure of all systems, as well as mixed ones) and the ability to replace failed systems with healthy ones. Such tests are necessary because at the design stage a designer does not possess complete a priori information that would allow identifying the dependability indicators in advance and with a sufficient accuracy. An important source of dependability information is a system for collection of data on product operational performance. There are two primary types of dependability tests. One of them is the determinative test intended for evaluation of dependability indicators. It is typical for mass-produced products. Another type of test is the control test designed to verify the compliance of a system’s dependability indicators with the specifications. This paper is dedicated to the first type of tests. It shows the procedure for statistical tests of radioelectronic systems using various procedures. Evaluation of the mean time to failure is usually performed by means of the method of maximum likelihood. The essence of the method is that in the process of statistical data processing the likelihood function is found, while the required parameter ( is the evaluation of parameter t*) equals to the argument value under which the likelihood function is maximal. The evaluation of the mean time to failure is a point estimate of the initial parameter t*, which in turn is a random value and within a specific test can take any positive value from 0 to ∞. Therefore, in addition to the point estimation an interval estimation of the measured parameter is usually performed. That means that estimation identifies the confidence interval ( ) in which the value of the measured parameter t* with a specified probability is found. Here are respectively the lower and upper limits of a confidence interval. The article considers two procedures of testing pilot batches of radioelectronic systems, and for each of them the following dependability indicators are defined: evaluation of mean time to failure; confidence interval of mean time to failure. It is shown that for the purpose of identifying the mean time to failure, test procedure [n, V, r] is more efficient than procedure [n, B, r].
About the Authors
B. I. FilippovRussian Federation
Candidate of Engineering, Assistant Professor, Senior Lecturer in Information Protection, Novosibirsk State Technical University. Russia, 630099, Novosibirsk, Uritskogo Str., 17, app. 13, phone: +7 (923) 225 67 21
Yu. V. Zamiatina
Russian Federation
student, Information Protection Department, Novosibirsk State Technical University. Russia, 630017, Novosibirsk, B. Bogatkova Str., 192/5, app. 183, phone: +7 (913) 209 46 56
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Review
For citations:
Filippov B.I., Zamiatina Yu.V. Identification of dependability indicators of manufactured samples of radioelectronic systems. Dependability. 2017;17(1):27-31. https://doi.org/10.21683/1729-2646-2017-17-1-27-31