METHODOLOGICAL IMPRECISION OF PREDICTION OF ELECTRONICS’ MEAN LIFE TIME
https://doi.org/10.21683/1729-2646-2015-0-1-5-12
Abstract
The paper presents the methods for evaluating the mean time to failure (MTTF) of electronics products based on the application of DN distribution for various experimental and reference data on reliability – failure rate, failure probabilities, minimal time to failure, FIT. It is noted that MTTF predictive estimates based on exponential distribution are overstated by 70-500 times as compared to those based on DN distribution.
About the Authors
Yu. N. Kofanov
MIEM NIU VSHE
Russian Federation
Doctor of Technical Sciences, professor, President of Russian Academy of Dependability, member of RAEN and MAI, professor
Russian Federation
Doctor of Technical Sciences, professor, President of Russian Academy of Dependability, member of RAEN and MAI, professor
V. P. Strelnikov
Institute of Mathematic Machines and Systems Problems, Ukrainian National Academy of Science
Ukraine
Doctor of Technical Sciences, member of Russian Academy of Dependability, Deputy Director for Researches
Ukraine
Doctor of Technical Sciences, member of Russian Academy of Dependability, Deputy Director for Researches
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Review
For citations:
Kofanov Yu.N., Strelnikov V.P. METHODOLOGICAL IMPRECISION OF PREDICTION OF ELECTRONICS’ MEAN LIFE TIME. Dependability. 2015;(1):5-12. https://doi.org/10.21683/1729-2646-2015-0-1-5-12
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ISSN 1729-2646 (Print)
ISSN 2500-3909 (Online)
ISSN 2500-3909 (Online)
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